Research Experience for Undergraduates
- NSF Summer Research Experience for Undergraduates in Trustable Embedded Systems Security Research
- Departments of Electrical and Computer Engineering and Computer Science and Engineering
- May 29 - August 3, 2018
The National Science Foundation has funded a 10-week summer program opportunity for undergraduates to work on cutting-edge research in computer systems security and trustable computing systems at the University of Connecticut
- Work on summer research projects guided by faculty mentor
- Get involved with exciting research with an impact on national security
- Interact with graduate students and learn what graduate study is all about
- Participate in weekly seminars on professional and research topics
- Attend an international symposium on computer systems security
- Improve communication, writing, and presentation skills
Possible Research Projects
- Implementation of Cryptographic Algorithms
- Role-Based Access Control for Mobile Computing and Applications
- Secure Cloud Computing
- Secure Mobile Computing
- Secure Operating Systems and Data Storage
- Secure Computer Systems and Hardware Auditing
- Secure Processor Architectures
- Secure Voting Systems
Who can apply: Undergraduate students in EE/COMPE/CS or related areas and completing their freshman, sophomores or junior years. High school graduates who have been accepted at an undergraduate institution but who have not yet started their undergraduate study are also eligible to participate. Must be a US citizen or permanent resident.
Program details: $500/week stipend, on-campus housing and meals provided, travel support is available. Activities include workshops on graduate careers, field trips to local industry, and social programs.
Applications: Enrollment for 2018 has ended.
Contact Dr. Bing Wang at 860-486-0582 or email@example.com for more information. There is no specific deadline; we enroll on a rolling basis. The program is supported with a grant from the National Science Foundation (CISE and DUE divisions).